Towards an understanding of the molecular mechanisms of durable and non-durable resistance to stripe rust in wheat

Xianming Chen


USDA-ARS Wheat Genetics, Quality, Physiology and Disease Research Unit, Pullman, WA

T. Coram, X. L. Huang, M. N. Wang, and A. Dolezal



Stripe rust of wheat, caused by Puccinia striiformis f. sp. tritici, continues to cause severe damage worldwide. Durable resistance is a key for sustainable control of the disease. High-temperature adult-plant (HTAP) resistance, which expresses when the weather becomes warm and plants grow old, has been demonstrated to be durable. We have conducted numerous of studies for understanding molecular mechanisms of different types of stripe rust resistance using a transcriptomics approach. Through comparing gene expression patterns with racespecific, all-stage resistance controlled by various genes, we found that a greater diversity of genes is involved in HTAP resistance. The genes involved in HTAP resistance are induced more slowly and their expression induction is less dramatic than genes involved in all-stage resistance. The high diversity of genes and less dramatic expression induction may explain the durability and incomplete level of HTAP resistance. Identification of transcripts may be helpful in identifying resistance controlled by different genes and in selecting better combinations of genes for pyramiding to achieve adequate and more durable resistance.