Molecular screening and identification the carriers of effective Yr genes in wheat germplasm of Central Asia

Alma Kokhmetova


Institute of Plant Biology and Biotechnology

Makpal Atishova, Aygul Madenova, Kanat Galymbek, Jenis Keyshilov, Hafiz Muminjanov, Alexey Morgounov



Wheat rust diseases are a major cause of yield losses of this crop. Yellow (Puccinia striiformis f. sp. tritici) rust is of the most widespread and dangerous disease of wheat and is the major factor that adversely affects wheat yield and quality. The use of genetic host resistance is the most effective, economical and environmentally safe method of controlling stripe rust that allows elimination of fungicides and minimize crop losses from this disease. Due to the threat of the development of epiphytoties of rust disease it is necessary to identify new donors of resistance to yellow rust and to develop resistant wheat breeding material. In the present study, attention was drawn to the effective yellow rust resistance genes Yr5, Yr10 and Yr15, which were identified in the process of molecular screening of wheat germplasm. Genetic analysis using S23M41 molecular marker linked to Yr5 revealed the presence of this gene in 17 out of 136 promising lines. Thirteen genotypes screened with Xbarc8 generated the DNA fragment associated with Yr15. Three advanced lines with Yr10 were identified using the SCAR marker. Three lines carrying two Yr genes (Yr5 and Yr15) were detected. Combination of Yr5 and Yr10 were found in 15 wheat lines. We identified a number of wheat genotypes highly resistant to stripe rust, which could be further evaluated to release new resistant varieties or to be used in the breeding program.