Linkage Mapping of Stem Rust Resistance Gene(s) in Spring Wheat Line CI14275

Zennah Kosgey


University of Minnesota, St. Paul, MN 55108, U.S.A

Ruth Dill-Macky, Ruth Wanyera, Sridhar Bhavani, Worku Bulbula, Matthew Rouse

APR    



Stem rust caused by Puccinia graminis f.sp. tritici (Pgt) is one of the major constraints to wheat (Triticum aestivum) production worldwide. Pgt races have rapidly evolved in several geographical regions due to the deployment of single resistance genes resulting in boom and bust cycles, hence combinations of resistance genes through pyramiding ensures durability of resistance in wheat varieties. Spring wheat line CI14275 displayed high levels of field resistance to stem rust in Kenya and USA compared to the parents in its pedigree (Thatcher, Kenya Farmer & Lee). To understand the genetics of resistance in CI14275, 114 Recombinant Inbred lines (RILs) were developed from the cross CI14275/LMPG-6 and screened for seedling response to Pgt races TTTTF, TPMKC, TRTTF, TTKSK & RTQQC. Chi-square goodness of fit tests suggested one-gene, three-genes, and four-genes segregated for response to races TTTTF, TPMKC and RTQQC, respectively. The RILs were all susceptible to races TTKSK and TRTTF. CI14275 showed intermediate low infection types only against races TPMKC (23-) and TTTTF (1+3C). Field screening of the population was completed in Kenya, Ethiopia and St. Paul where CI14275 showed high levels of resistance TMR (Kenya), 5MS (Ethiopia) and 5RMR (St. Paul) against the prevalent races in the stem rust screening platforms. LMPG-6 displayed susceptible responses ranging from 70S-90S in the three locations. 90K wheat Single Nucleotide Polymorphism (SNP) marker platform will be used to genotype parents and the population.